
			
						Survey: 2025 eBeam Initiative Luminaries Survey Results [September 23, 2025]
>> View
						Presentation: Technology Analysis of Leading-Edge Semiconductor Manufacturing, Tetsuya Wadaki, Morgan Stanley MUFG [September 23, 2025]
>> View
						Press: eBeam Initiative Survey Predicts Continued Growth in Photomask Market This Year - AGC Joins eBeam Initiative  [September 23, 2025] 
						>> English,
						Japanese,
						Simplified Chinese &
						Traditional Chinese
						Event: eBeam Initiative Reception during SPIE Photomask Technology + EUV Conference, Monterey, Calif.; 5:00–7:15pm Sept. 23, 2025 
							>> RSVP
						Videos: Summer 2025 Fine Line Video Journal [June 3, 2025]
>> View
						Presentation: Full-Reticle Curvilinear Inline Linearity Correction Including Variable Bias with Zero Turnaround Time by Paris Spinelli, Micron, at PMJ 2025 [April 18, 2025]
>> View
						Presentation: Three Ways to Improve Wafer Uniformity by Aki Fujimura, D2S at PMJ 2025 [April 18, 2025]
>> View
						Videos: Spring 2025 Fine Line Video Journal [March 26, 2025]
>> View
						Presentation: PLDC Improves Uniformity and Linearity for All Masks by Aki Fujimura, D2S [February 25, 2025]
>> View
						Event: Save the Date for the PMJ 2025 Finale hosted by the eBeam Initiative. Friday, April 18 right after the final session in the PMJ program and in the same room, the Annex Hall, Pacifico Yokohama. 
							>> RSVP
						Press: eBeam Initiative Member Companies to Take Center Stage at SPIE Advanced Lithography and Patterning Conference [February 18, 2025]
>> View
						
						Survey: 2025 Deep Learning Applications List by eBeam Initiative members [February 18, 2025]
>> View
						Event:
						eBeam Initiative SPIE-AL Annual Lunch and Members Meeting, Tuesday, February 25, 2025
						
						Videos: Autumn 2024 Fine Line Video Journal [October 28, 2024]
>> View
						Survey:  2024 eBeam Initiative Luminaries Survey Results [October 1, 2024]
>> View
						
>>View Features Archive
						
Mission | The Initiative provides a forum for educational and promotional activities regarding a new design-to-manufacturing approach, known as Design for e-beam (DFEB), that reduces mask costs for semiconductor devices.
Technology | DFEB is a design and software approach to enhance the throughput of e-beam lithographic exposure.  DFEB uses character projection (CP) technology combined with design and software techniques to reduce a design's required shot count, resulting in increased CP e-beam direct-write (EbDW) throughput.
Applications | Systems companies seeking all-layer custom SoC prototypes; low-to-mid-volume semiconductor companies producing maskless test chips, engineering samples, and derivative chips; and supercomputing applications.
Design Team Advisors | Provide business and technical insights and requirements to the Steering Group and Ecosystem members.
Marty Deneroff, D. E. Shaw Research
Jack Harding, eSilicon Corporation
Colin Harris, PMC-Sierra
Riko Radojcic, Qualcomm
Jean-Pierre Geronimi, STMicroelectronics
				Semiconductor Engineering: Expert Panel Sees History of Continuous Photomask Innovations as Key to the Future [October 27, 2025]
>> View
Semiconductor Digest: eBeam Initiative Survey of Semiconductor Luminaries Predicts Continued Growth in Photomask Market This Year. [September 23, 2025]
>> View
Semiconductor Digest: PLDC: A Robust MPC Solution for Any Mask Shape With Zero Impact on Turnaround Time [September 05, 2025]
>> View
EE Times: U.S. Startups Debut First E-Beam Tools for Wafer Writing [August 11, 2025]
>> View
Semiecosystem: Multibeam Obtains Funding For Next-Gen E-Beam Lithography [July 31, 2025]
>> View
Semiconductor Engineering: 40th EMLC Honors Three Decades Of Vision From Dr. Uwe Behringer [July 24, 2025]
>> View
Semiconductor Engineering: Disruptive Changes Ahead For Photomasks? [June 25, 2025]
>> View
				
>>View News Archive