News & Events

Initiative Press Releases:

  • eBeam Initiative Members Present Collaborative Results at SPIE/BACUS Photomask Symposium 2011 - Five Additional Companies Join eBeam Initiative, September 12, 2011
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  • Fellow eBeam Initiative Members D2S and NuFlare Partner to Reduce Write Times for Complex 22-nm Photomask - D2S Option to NuFlare EBM-700 System Enalbes Design for E-Beam (DFEB) Mask Technology , March 1, 2011
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  • eBeam Initiative Members Present Collaborative Results at SPIE Advanced Lithography Symposium 2011 - E-beam Advancements Featured for both Complex Photomasks and Maskless Lithography; New Members Added to eBeam Initiative, February 22, 2011
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  • eBeam Initiative Members Jointly Present Collaborative Results at SPIE/BACUS Symposium 2010 - Four New Members Join eBeam Initiative, September 7, 2010
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  • eBeam Initiative Members Publish Collaborative Results at Photomask Japan 2010 - Three New Companies Join eBeam Initiative, April 13, 2010
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  • eBeam Membership Grows to 27 - Initiative Introduces DFEB Mask Roadmap for High Volume Integrated Circuits, February 23, 2010
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  • eBeam Initiative Members Collaborate to Enhance Design for E-Beam Throughput, October 1, 2009
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  • GenISys GMBH Joins the eBeam Initiative Roster to Accelerate the Adoption of Design for E-Beam Technology, Sept. 14, 2009
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  • Silicon Results Validate Design for e-Beam Methodology at the 65-nm node, May 26, 2009
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  • eBeam Initiative Members to Present at Magma User Conference - March 26, 2009
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  • 20 Electronics Industry Leaders Collaborate to Accelerate Development and Adoption of Design for E-Beam Technology
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  • Members Quote Sheet
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FAQ

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eBeam Industry News

ElectroIQ: Mask-wafer double simulation: A new lithography requirement at 22nm [December 30, 2011]
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SemiMD: E-beam Costs to Soar in Multi-Patterning Era – Mark LaPedus [October 22, 2011]
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SST WaferNews: SPIE BACUS: Better 20nm litho, and where’s the EUV funding? Having your cake and eating it, too [October 11, 2011]
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SemiMD: BACUS Panel Considers Model-based Data Prep – Marc David Levenson [October 7, 2011]
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ElectroIQ: SPIE BACUS: Delayed Photomask Japan 2011 in a nutshell – Franklin Kalk [September 21, 2011]
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GSA Forum: The Lithography Gap Widens at the 20nm Logic Node: New eBeam Approaches Required to Complete the Design Chain [September 2011]
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EETimes: eBeam Initiative expands membership [September 12, 2011]
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